BX605
BX series are 50MHz or 100MHz Memory Burn in Tester with 200MHz pattern generator, timing generator and formatter integrated
Provides Test program Development tool and data Analysis tool
System Specification
- Dimensions : 3400(W)×1800(D)×2153(H)mm
- Weight : 3.2 T
- Zone : 4
- Slot per Zone : 8
- Clock Rate Range : Up to 50MHZ
- Channel / Slot : Main PPS 8CH (PPS 1,2,4,5,6,7,8,9) / HV PPS 3Ch (PPS3, PPS10, PPS11)
- Total Current : 363A
- Type of Chamber : 2 Chamber
- Storage of Chamber : Up to 5.5 Kw
DRAM, NAND Flash and PRAM Support
50MHz or Less
Full Functionality Test
40℃ to +125℃
Flexible Per Site BI Testing
Automation Ready