SSD Test TOP PCIe Functional Test SATA / SAS Functional Test Burn-In Self Test PCIe Gen 5 Test FXBI FXBI is Cost optimized for BIST testing in HVM manufacturingHigh density for excellent parallelism up to 64 DUTs / moduleNIST calibrated independent power supplies to each DUTsSupport of UART and OOB signalsAsynchronous or batch mode testing supported M.2, U2, U.3, EDSFF and AIC Form Factors supported DUT module based – facilitates quick change between Form FactorsParallelism based on FF and Protocol - up to 384 SSDs per rackCustomer can select ambient rack or hot temperature chamber Menu