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Memory Burn-In Test

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BX605

BX series is 50MHz or 100MHz Memory Burn in Tester with 200MHz pattern generator, timing generator and formatter integrated. Provides test program development tool and data analysis tool. 

DRAM, NAND Flash and PRAM Support 

50MHz or Less

Full Functionality Test 

40℃ to +125℃

Flexible Per Site BI Testing

Automation Ready