서브컨텐츠

Products

Memory Burn-In Test

TOP

BX605

BX series are 50MHz or 100MHz Memory Burn in Tester with 200MHz pattern  generator, timing generator and formatter integrated

 

Provides Test program Development tool and data Analysis tool

 

System Specification

- Dimensions : 3400(W)×1800(D)×2153(H)mm 

- Weight : 3.2 T

- Zone : 4

- Slot per Zone : 8

- Clock Rate Range : Up to 50MHZ

- Channel / Slot : Main PPS 8CH (PPS 1,2,4,5,6,7,8,9) / HV PPS 3Ch (PPS3, PPS10, PPS11)

- Total Current : 363A

- Type of Chamber : 2 Chamber

- Storage of Chamber : Up to 5.5 Kw 


DRAM, NAND Flash and PRAM Support 

50MHz or Less

Full Functionality Test 

40℃ to +125℃

Flexible Per Site BI Testing

Automation Ready