서브컨텐츠

Products

Memory Burn-In Test

TOP

BX620


HSBI (High Speed Memory Burn in Tester) is 200MHz / 400MBPS Memory Burn in Tester with 200MHz Pattern generator, Timing generator and Form factors integrated


It provides fail memory and redundancy analysis processor as optional


Test program development tool and data analysis tool are included

Support DDR4 / 5 DRAM, LPDDR, NAND Flash


200MHz Pattern Sequencer


Full Functionality Test 


220A DPS per slot 


C++ Based Test Program 


-20℃ to +150℃, Flexible zone, -40℃option 


2 Chamber 24 slots 



Automation Ready