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Memory Burn-In Test

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BX620

HSBI (High Speed Memory Burn in Tester) is 200MHz/400MBPS Memory Burn in Tester with 200MHz pattern generator, timing generator and formatter integrated. It provides fail memory and redundancy analysis processor as optional. Test program development tool and data analysis tool are included.

DDR4/5 DRAM, LPDDR, NAND FlashSupport 

200MHz Pattern Sequencer

Full Functionality Test 

220A DPS per slot 

C++ Based Test Program 

-20℃ to +150℃, Flexible zone, -40℃option 

2 chamber 24 slots 

Automation Ready