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Memory Burn-In Test

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BX610

BX series is 50MHz or 100MHz Memory Burn in Tester with 200MHz pattern generator, timing generator and formatter integrated. Provides test program development tool and data analysis tool.
DDR DRAM, LPDDR, NAND Flash, PRAM Support 
50MHz, 100MHz Clock Speed 
Full Functionality Test 
100MHz Pin Electronics Applied 
240A DPS per slot 
C++ Based Test Program 
-20℃ to +150℃, Flexible zone, -40℃ option 
4 chamber 24 slots 
Automation Ready