• PCIe Functional Test
• BX Series
• Automated SSD Test
• SATA / SAS Functional Test
• Chorus Series
• Burn-In Self Test
• HSBI Series
• PCIe Gen 5 Test
• THB / bHAST
• Automated DIMM Module Test

Universal Monitoring Burn-in Tester for DRAM and Flash Memory Packages. By controlling each temperature zone at different condition, customer is able to maximize system utilization at reliability verification test. The system has capability to test all functional items.