서브컨텐츠

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DRAM Module Test

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Description

We provide our customers with Automated SLT (System Level Test) Solutions for DRAM Module HVM test. Our solution gives our customers the best possible combination of technologies for the best performances and manufacturing effiencies - increasing yield, reducing cost of ownership and accelerating time-to-market. The integrated system with CMB (custom designed Motherboard), Thermal subsystem and Automation technologies provides a Turn-key Automated Test System which reduces Integration risks and time to Volume Production. Our Automated DIMM SLT (System Level Test) System is highly configurable to address our customers needs and environments constraints for Best Cost of Ownership, Best Performance and shortest Time to Yield.