PRODUCT

MEMORY TESTER

Description

Burn-in test is an electrical stress test that employs voltage and temperature to accelerate the electrical failure of a memory device IC.

Burn-in test may be used as a reliability monitor or as a production screen to weed out potential failure-defects of the memory devices.

DIMM MODULE TEST

BX1404HC-24 Memory Burn In Tester

CHORUS 1606HC-24